Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse

Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse

Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can reach the point of saturation in which certain atomic species in the sample lose most of their...

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Bibliographic Details
Main Authors: Galli, L., Son, S.-K., Klinge, M., Bajt, S., Barty, A., Bean, R., Betzel, C., Beyerlein, K. R., Caleman, C., Doak, R. B., Duszenko, M., Fleckenstein, H., Gati, C., Hunt, B., Kirian, R. A., Liang, M., Nanao, M. H., Nass, K., Oberthür, D., Redecke, L., Shoeman, R., Stellato, F., Yoon, C. H., White, T. A., Yefanov, O., Spence, J., Chapman, H. N.
Format: Online
Language:English
Published: American Crystallographic Association 2015
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711609/

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https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711609/

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