In situ X-ray diffraction and the evolution of polarization during the growth of ferroelectric superlattices

In situ X-ray diffraction and the evolution of polarization during the growth of ferroelectric superlattices

In epitaxially strained ferroelectric thin films and superlattices, the ferroelectric transition temperature can lie above the growth temperature. Ferroelectric polarization and domains should then evolve during the growth of a sample, and electrostatic boundary conditions may play an important role...

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Bibliographic Details
Main Authors: Bein, Benjamin, Hsing, Hsiang-Chun, Callori, Sara J., Sinsheimer, John, Chinta, Priya V., Headrick, Randall L., Dawber, Matthew
Format: Online
Language:English
Published: Nature Publishing Group 2015
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4686826/

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https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4686826/

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