Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy

Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM wor...

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Bibliographic Details
Main Authors: Ishibashi, Takayuki, Cai, Yongfu
Format: Online
Language:English
Published: Springer US 2015
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4586183/