Analysis and prediction of defects in UV photo-initiated polymer microarrays† †Electronic supplementary information (ESI) available. See DOI: 10.1039/c2tb00379a Click here for additional data file.

Defect occurrence within polymers was successfully predicted in 85% of cases using a PLS regression model based upon molecular descriptors.

Bibliographic Details
Main Authors: Hook, Andrew L., Scurr, David J., Burley, Jonathan C., Langer, Robert, Anderson, Daniel G., Davies, Martyn C., Alexander, Morgan R.
Format: Online
Language:English
Published: Royal Society of Chemistry 2013
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4357255/