Quantum-enhanced metrology for multiple phase estimation with noise

We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estim...

Full description

Bibliographic Details
Main Authors: Yue, Jie-Dong, Zhang, Yu-Ran, Fan, Heng
Format: Online
Language:English
Published: Nature Publishing Group 2014
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4123202/
id pubmed-4123202
recordtype oai_dc
spelling pubmed-41232022014-08-14 Quantum-enhanced metrology for multiple phase estimation with noise Yue, Jie-Dong Zhang, Yu-Ran Fan, Heng Article We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estimation (SE) of multiple phases is always better than individual estimation (IE) of each phase even in noisy environment. The utility of the bounds of multiple phase estimation for photon loss channels is exemplified explicitly. When noise is low, those bounds possess the Heisenberg scale showing quantum-enhanced precision with the O(d) advantage for SE, where d is the number of phases. However, this O(d) advantage of SE scheme in the variance of the estimation may disappear asymptotically when photon loss becomes significant and then only a constant advantage over that of IE scheme demonstrates. Potential application of those results is presented. Nature Publishing Group 2014-08-04 /pmc/articles/PMC4123202/ /pubmed/25090445 http://dx.doi.org/10.1038/srep05933 Text en Copyright © 2014, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
repository_type Open Access Journal
institution_category Foreign Institution
institution US National Center for Biotechnology Information
building NCBI PubMed
collection Online Access
language English
format Online
author Yue, Jie-Dong
Zhang, Yu-Ran
Fan, Heng
spellingShingle Yue, Jie-Dong
Zhang, Yu-Ran
Fan, Heng
Quantum-enhanced metrology for multiple phase estimation with noise
author_facet Yue, Jie-Dong
Zhang, Yu-Ran
Fan, Heng
author_sort Yue, Jie-Dong
title Quantum-enhanced metrology for multiple phase estimation with noise
title_short Quantum-enhanced metrology for multiple phase estimation with noise
title_full Quantum-enhanced metrology for multiple phase estimation with noise
title_fullStr Quantum-enhanced metrology for multiple phase estimation with noise
title_full_unstemmed Quantum-enhanced metrology for multiple phase estimation with noise
title_sort quantum-enhanced metrology for multiple phase estimation with noise
description We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estimation (SE) of multiple phases is always better than individual estimation (IE) of each phase even in noisy environment. The utility of the bounds of multiple phase estimation for photon loss channels is exemplified explicitly. When noise is low, those bounds possess the Heisenberg scale showing quantum-enhanced precision with the O(d) advantage for SE, where d is the number of phases. However, this O(d) advantage of SE scheme in the variance of the estimation may disappear asymptotically when photon loss becomes significant and then only a constant advantage over that of IE scheme demonstrates. Potential application of those results is presented.
publisher Nature Publishing Group
publishDate 2014
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4123202/
_version_ 1613121412022665216