Absence of Evidence ≠ Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films

Absence of Evidence ≠ Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films

Assertions that a new material may offer particularly advantageous properties should always be subjected to careful critical evaluation, especially when those properties can be affected by the presence of inclusions at trace level. This is particularly important for claims relating to new multiferro...

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Bibliographic Details
Main Authors: Schmidt, Michael, Amann, Andreas, Keeney, Lynette, Pemble, Martyn E., Holmes, Justin D., Petkov, Nikolay, Whatmore, Roger W.
Format: Online
Language:English
Published: Nature Publishing Group 2014
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4100018/

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https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4100018/

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