Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum

Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum

The English grain aphid, Sitobion avenae (F.) (Homoptera: Aphididae), is a dominant and destructive pest in wheat, Triticum estivum L. (Poales: Poaceae), production regions in China and other grain-growing areas worldwide. Patterns of gene expression of the S. avenae-resistant synthetic wheat line 9...

Full description

Bibliographic Details
Main Authors: Wang, Chun-Ping, Wang, Zheng-Hong, Zhao, Hui-Yan, Zhu, Qi-Di, Luo, Kun, Wang, Li-Ming, Dong, Pu-Hui
Format: Online
Language:English
Published: University of Wisconsin Library 2013
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3835026/
id pubmed-3835026
recordtype oai_dc
spelling pubmed-38350262013-11-26 Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum Wang, Chun-Ping Wang, Zheng-Hong Zhao, Hui-Yan Zhu, Qi-Di Luo, Kun Wang, Li-Ming Dong, Pu-Hui Article The English grain aphid, Sitobion avenae (F.) (Homoptera: Aphididae), is a dominant and destructive pest in wheat, Triticum estivum L. (Poales: Poaceae), production regions in China and other grain-growing areas worldwide. Patterns of gene expression of the S. avenae-resistant synthetic wheat line 98-10-35, the S. avenae-susceptible line1376, and their hybrid population, and the differences in segments between 98-10-35/1376 F3 resistant plants and resistant parents of 98-10-35, as well as those between the F3 resistant and susceptible populations, were examined with differential display reverse transcription PCR. The results showed that five patterns of differential expression were detected between the progeny and its resistant parents: 1) The gene was silenced in one of the parents; 2) Special expression showed in the progeny; 3) Expression was consistent with the resistant parents; 4) Up expression showed in the progeny but not in the parents; 5) Down expression showed in the progeny but not in the parents. Paired t-test results were not significant; however, the probability value (0.9158) indicated that gene expression on the RNA level were consistent with resistant bands found in F3 resistant individuals and resistant parents, as well as the F3 resistant and susceptible populations. For both the F3 of 98-10-35/1376 and the parents, the total number of amplified bands was 202, with an average of 25.3 per primer. The number of differential bands was 116, with an average of 14.5 per primer amplified and a polymorphism ratio of 56.3%. In the present study, differential expression genes in the resistant line 98-10-35 were all up-regulated. Among them, gene expression of resistant groups in the F3 population was in agreement with patterns 2, 3, and 4. However, the susceptible line 1376 did not have this gene expression on the RNA level. This pattern is expected to be used to select and analyze target genes from the same F3 population and the resistant parents. The results suggest that it can be employed as a new method for molecular assisted breeding. University of Wisconsin Library 2013-09-22 /pmc/articles/PMC3835026/ /pubmed/24205793 http://dx.doi.org/10.1673/031.013.9001 Text en © 2013 http://creativecommons.org/licenses/by/2.5/ This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
repository_type Open Access Journal
institution_category Foreign Institution
institution US National Center for Biotechnology Information
building NCBI PubMed
collection Online Access
language English
format Online
author Wang, Chun-Ping
Wang, Zheng-Hong
Zhao, Hui-Yan
Zhu, Qi-Di
Luo, Kun
Wang, Li-Ming
Dong, Pu-Hui
spellingShingle Wang, Chun-Ping
Wang, Zheng-Hong
Zhao, Hui-Yan
Zhu, Qi-Di
Luo, Kun
Wang, Li-Ming
Dong, Pu-Hui
Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
author_facet Wang, Chun-Ping
Wang, Zheng-Hong
Zhao, Hui-Yan
Zhu, Qi-Di
Luo, Kun
Wang, Li-Ming
Dong, Pu-Hui
author_sort Wang, Chun-Ping
title Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
title_short Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
title_full Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
title_fullStr Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
title_full_unstemmed Expression of Potential Resistance Genes to the English Grain Aphid, Sitobion avenae, in Wheat, Triticum aestivum
title_sort expression of potential resistance genes to the english grain aphid, sitobion avenae, in wheat, triticum aestivum
description The English grain aphid, Sitobion avenae (F.) (Homoptera: Aphididae), is a dominant and destructive pest in wheat, Triticum estivum L. (Poales: Poaceae), production regions in China and other grain-growing areas worldwide. Patterns of gene expression of the S. avenae-resistant synthetic wheat line 98-10-35, the S. avenae-susceptible line1376, and their hybrid population, and the differences in segments between 98-10-35/1376 F3 resistant plants and resistant parents of 98-10-35, as well as those between the F3 resistant and susceptible populations, were examined with differential display reverse transcription PCR. The results showed that five patterns of differential expression were detected between the progeny and its resistant parents: 1) The gene was silenced in one of the parents; 2) Special expression showed in the progeny; 3) Expression was consistent with the resistant parents; 4) Up expression showed in the progeny but not in the parents; 5) Down expression showed in the progeny but not in the parents. Paired t-test results were not significant; however, the probability value (0.9158) indicated that gene expression on the RNA level were consistent with resistant bands found in F3 resistant individuals and resistant parents, as well as the F3 resistant and susceptible populations. For both the F3 of 98-10-35/1376 and the parents, the total number of amplified bands was 202, with an average of 25.3 per primer. The number of differential bands was 116, with an average of 14.5 per primer amplified and a polymorphism ratio of 56.3%. In the present study, differential expression genes in the resistant line 98-10-35 were all up-regulated. Among them, gene expression of resistant groups in the F3 population was in agreement with patterns 2, 3, and 4. However, the susceptible line 1376 did not have this gene expression on the RNA level. This pattern is expected to be used to select and analyze target genes from the same F3 population and the resistant parents. The results suggest that it can be employed as a new method for molecular assisted breeding.
publisher University of Wisconsin Library
publishDate 2013
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3835026/
_version_ 1612029084987031552

Similar Items