Characterization of electroforming-free titanium dioxide memristors

Characterization of electroforming-free titanium dioxide memristors

Metal–insulator–metal (MIM) structures based on titanium dioxide have demonstrated reversible and non-volatile resistance-switching behavior and have been identified with the concept of the memristor. Microphysical studies suggest that the development of sub-oxide phases in the material drives the r...

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Bibliographic Details
Main Authors: Strachan, John Paul, Yang, J Joshua, Montoro, L A, Ospina, C A, Ramirez, A J, Kilcoyne, A L D, Medeiros-Ribeiro, Gilberto, Williams, R Stanley
Format: Online
Language:English
Published: Beilstein-Institut 2013
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3740802/

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https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3740802/

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