The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods
We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON)...
| Main Authors: | , , , |
|---|---|
| Format: | Online |
| Language: | English |
| Published: |
Beilstein-Institut
2012
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3512122/ |