Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation

The aim of this work is to determine the thermal conductivity of mesoporous silicon (PoSi) by fitting the experimental results with simulated ones. The electrothermal response (resistance versus applied current) of differently designed test lines integrated onto PoSi/silicon substrates and the bulk...

Full description

Bibliographic Details
Main Authors:	Siegert, Laurent, Capelle, Marie, Roqueta, Fabrice, Lysenko, Vladimir, Gautier, Gael
Format:	Online
Language:	English
Published:	Springer 2012
Online Access:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3463460/

id	pubmed-3463460
recordtype	oai_dc
spelling	pubmed-34634602012-10-04 Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation Siegert, Laurent Capelle, Marie Roqueta, Fabrice Lysenko, Vladimir Gautier, Gael Nano Express The aim of this work is to determine the thermal conductivity of mesoporous silicon (PoSi) by fitting the experimental results with simulated ones. The electrothermal response (resistance versus applied current) of differently designed test lines integrated onto PoSi/silicon substrates and the bulk were compared to the simulations. The PoSi thermal conductivity was the single parameter used to fit the experimental results. The obtained thermal conductivity values were compared with those determined from Raman scattering measurements, and a good agreement between both methods was found. This methodology can be used to easily determine the thermal conductivity value for various porous silicon morphologies. Springer 2012-07-31 /pmc/articles/PMC3463460/ /pubmed/22849851 http://dx.doi.org/10.1186/1556-276X-7-427 Text en Copyright ©2012 Siegert et al.; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
repository_type	Open Access Journal
institution_category	Foreign Institution
institution	US National Center for Biotechnology Information
building	NCBI PubMed
collection	Online Access
language	English
format	Online
author	Siegert, Laurent Capelle, Marie Roqueta, Fabrice Lysenko, Vladimir Gautier, Gael
spellingShingle	Siegert, Laurent Capelle, Marie Roqueta, Fabrice Lysenko, Vladimir Gautier, Gael Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
author_facet	Siegert, Laurent Capelle, Marie Roqueta, Fabrice Lysenko, Vladimir Gautier, Gael
author_sort	Siegert, Laurent
title	Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
title_short	Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
title_full	Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
title_fullStr	Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
title_full_unstemmed	Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
title_sort	evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation
description	The aim of this work is to determine the thermal conductivity of mesoporous silicon (PoSi) by fitting the experimental results with simulated ones. The electrothermal response (resistance versus applied current) of differently designed test lines integrated onto PoSi/silicon substrates and the bulk were compared to the simulations. The PoSi thermal conductivity was the single parameter used to fit the experimental results. The obtained thermal conductivity values were compared with those determined from Raman scattering measurements, and a good agreement between both methods was found. This methodology can be used to easily determine the thermal conductivity value for various porous silicon morphologies.
publisher	Springer
publishDate	2012
url	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3463460/
_version_	1611913474331377664

Evaluation of mesoporous silicon thermal conductivity by electrothermal finite element simulation

Similar Items