A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
We have developed a new method of controlling the pipette for scanning ion conductance microscopy to obtain high-resolution images faster. The method keeps the pipette close to the surface during a single line scan but does not follow the exact surface topography, which is calculated by using the io...
| Main Authors: | , , , , |
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| Format: | Online |
| Language: | English |
| Published: |
Elsevier
2012
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3462995/ |