System design for enhanced in situ monitoring of ionizing radiation effects in semiconductor devices
The amount of ionizing radiation that semiconductor devices encounter during their lifecycle degrades both of theirfunctional and electrical parameter performances. Different radiation environments either in space, high energy physics experiments, nuclear environment or fabrication process as well a...
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| Format: | Journal |
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Borneo Science (The Journal of Science and Technology), Universiti Malaysia Sabah
2009
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| Online Access: | http://www.myjurnal.my/public/article-view.php?id=20568 |