Phonon scattering by impurities in semiconductors
Thermal conductivity measurements have been used to study the low lying energy levels of Cr ions in GaAs. Strong resonant phonon scattering was observed in semi-insulating (SI) and p-type samples, which is attributed to Cr 2+ or Cr 3+ ions, while the scattering in the n-type samples additional to th...
| Main Author: | |
|---|---|
| Format: | Thesis (University of Nottingham only) |
| Language: | English |
| Published: |
1980
|
| Online Access: | http://eprints.nottingham.ac.uk/28992/ http://eprints.nottingham.ac.uk/28992/1/257219.pdf |