EBIC study of Au / n-type GaN Schottky contacts
The performance of Au / n-type GaN Schottky contacts is strongly dependent on the GaN surface processing prior to contacting. Current-voltage and EBIC line scans demonstrate that KOH treatment acts to degrade the Schottky contacts. EBIC imaging reveals the differing sub-grain boundary structures o...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Book Section |
| Language: | English |
| Published: |
IOP Publishing Ltd
2003
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| Online Access: | http://eprints.nottingham.ac.uk/1464/ http://eprints.nottingham.ac.uk/1464/1/Inst._Phys._Conf._Ser._180_%282003%29_pp_577-580.pdf |