The use of scanning electron microscope in evaluating insulation property

The use of scanning electron microscope in evaluating insulation property

Bibliographic Details
Main Authors: Sutjipto, Agus Geter Edy, Afzeri, Afzeri, Muhida, Riza, Sopyan, Iis, Haruman, Esa
Format: Book Chapter
Language:English
Published: IIUM Press 2011
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://irep.iium.edu.my/17609/
http://irep.iium.edu.my/17609/1/Chapter_20.pdf

Internet

http://irep.iium.edu.my/17609/
http://irep.iium.edu.my/17609/1/Chapter_20.pdf

Similar Items