Nanoindentation Response Analysis of Thin Film Substrates-II: Strain Hardening-Softening Oscillations in Subsurface Layer

We have extracted stress-strain field (SSF) gradient and divergence representations from nanoindentation data sets of bulk solids often used as thin film substrates: bearing and tooling steels, silicon, glasses, and fused silica. Oscillations of the stress-strain field gradient and divergence induce...

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Bibliographic Details
Main Authors: Kanders Uldis, Kanders Karlis
Format: Article
Language:English
Published: Sciendo 2017-04-01
Series:Latvian Journal of Physics and Technical Sciences
Subjects:
Online Access:http://www.degruyter.com/view/j/lpts.2017.54.issue-2/lpts-2017-0011/lpts-2017-0011.xml?format=INT