The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method

The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method

Forward modeling of diffraction peaks is a potential way to compare the results of theoretical mechanical simulations and experimental X-ray diffraction (XRD) data recorded during in situ experiments. As the input data are the strain or displacement field within a representative volume of the materi...

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Bibliographic Details
Main Authors: Komlavi Senyo Eloh, Alain Jacques, Gabor Ribarik, Stéphane Berbenni
Format: Article
Language:English
Published: MDPI AG 2018-09-01
Series:Materials
Subjects:
dislocations
diffraction
fast Fourier transform (FFT)-based method
discrete green operator
voxelization artifacts
sub-voxel method
simulated diffraction peaks
scattered intensity
Online Access:http://www.mdpi.com/1996-1944/11/9/1669

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http://www.mdpi.com/1996-1944/11/9/1669

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