Automatic parametric fault detection in complex analog systems based on a method of minimum node selection
The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter usi...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2016-09-01
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| Series: | International Journal of Applied Mathematics and Computer Science |
| Subjects: | |
| Online Access: | http://www.degruyter.com/view/j/amcs.2016.26.issue-3/amcs-2016-0045/amcs-2016-0045.xml?format=INT |