The application of Electron Backscatter Diffraction and Orientation Contrast Imaging in the SEM to textural problems in rocks

The application of Electron Backscatter Diffraction and Orientation Contrast Imaging in the SEM to textural problems in rocks

In a scanning electron microscope (SEM) an electron beam sets up an omni-directional source of scattered electrons within a specimen. Diffraction of these electrons will occur simultaneously on all lattice planes in the sample and the backscattered electrons (BSE),which escape from the specimen,will...

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Bibliographic Details
Main Authors: Prior, D., Boyle, A., Brenker, F., Cheadle, M., Day, A., Lopez, G., Peruzzo, L., Potts, G., Reddy, Steven, Spiess, R., Timms, Nicholas Eric, Trimby, P., Wheeler, J., Zetterstrom, L.
Format: Journal Article
Published: Mineralogical Society of America 1999
Online Access:http://www.minsocam.org
http://www.minsocam.org
http://hdl.handle.net/20.500.11937/6529

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http://www.minsocam.org
http://www.minsocam.org
http://hdl.handle.net/20.500.11937/6529

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