In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces

In situ synchrotron radiation grazing incidence X-ray diffraction - A powerful technique for the characterization of solid-state ion-selective electrode surfaces

An in situ surface study of the iron chalcogenide glass membrane ion-selective electrode (ISE) in aqueous media has been undertaken using a tandem technique of mixed potential/synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) and atomic force microscopy (AFM). This work has simult...

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Bibliographic Details
Main Authors: De Marco, Roland, Jiang, Zhong-Tao, Pejcic, Bobby, Van Riessen, Arie
Format: Journal Article
Published: Pergamon-Elsevier Science Ltd 2006
Subjects:
Ion-selective electrode
Electrode dynamics
Synchrotron radiation grazing incidence X-ray diffraction
Atomic force microscopy
Chalcogenide glass
Online Access:http://hdl.handle.net/20.500.11937/40911

Internet

http://hdl.handle.net/20.500.11937/40911

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