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Fabric defect detection based...
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Fabric defect detection based on sparse representation of main local binary pattern
Bibliographic Details
Main Authors:
Zhoufeng, Liu
,
Lei, Yan
,
Chunlei, Li
,
Yan, Dong
,
Guangshuai, Gao
Format:
text
Language:
eng
Published:
Emerald
2017
Subjects:
Defects detection,Main local binary pattern,Sparse representation,Texture reconstruction,Threshold segmentation
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