Modeling gate current of nano scale MOSFET for circuit simulation

Bibliographic Details
Main Authors:	Ashwani K., Rana, Narottam, Chand, Vinod, Kapoor
Format:	text
Language:	eng
Published:	Emerald 2011
Subjects:	MOSFET,Gate tunnelling,Nano scale effects,Gate oxide thickness,Source/drain overlap region,Simulation,Modelling

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