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VDMOSFET reliability dependenc...
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VDMOSFET reliability dependence on the integrated drain‐source junction
Bibliographic Details
Main Authors:
R., El Bitar
,
R., Habchi
,
C., Salame
,
A., Khoury
,
P., Mialhe
,
B., Nsouli
Format:
text
Language:
eng
Published:
Emerald
2009
Subjects:
Integrated circuits,Product reliability
Holdings
Description
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