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Majlis, B.B.Y.
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Majlis, B.B.Y.
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Majlis, B.B.Y.
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1
Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS device
by
Atan, N.B.
,
Ahmad, I.B.
,
Majlis
,
B.B.Y
.
Published 2017
Conference Paper
2
Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device
by
Atan, N.B.
,
Ahmad, I.B.
,
Majlis
,
B.B.Y
.
,
Fauzi, I.B.A.
Published 2017
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3
Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device
by
Atan, N.B.
,
Ahmad, I.B.
,
Majlis
,
B.B.Y
.
,
Fauzi, I.B.A.
Published 2017
Conference Paper
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