Ultrafast carrier thermalization and trapping in silicon-germanium alloy probed by extreme ultraviolet transient absorption spectroscopy

by Michael Zürch, Hung-Tzu Chang, Peter M. Kraus, Scott K. Cushing, Lauren J. Borja, Andrey Gandman, Christopher J. Kaplan, Myoung Hwan Oh, James S. Prell, David Prendergast, Chaitanya D. Pemmaraju, Daniel M. Neumark, Stephen R. Leone
Published 2017-07-01