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  1. 1

    Lightmetry 2002 : metrology and testing techniques using light by Pluta, Maksymilian, Powichrowska, Ewa, Szyjer, Mariusz

    Published 2003
    “…SPIE ,…”
  2. 2

    MEMS/MOEMS advances in photonic commmunications, sensing, metrology, packaging and assembly by Behringer, Uwe F.W

    Published 2003
    “…SPIE…”
  3. 3

    Opto-Ireland 2002 optical metrology, imaging, and machine vision by Mahon, James, Murtagh, Fionn D., Shearer, Andrew, Whelan, Paul F. 1963-

    Published 2003
    “…SPIE…”
  4. 4

    Metrology, inspection, and process control for microlithography XVII by Herr, Daniel J.

    Published 2003
    “…SPIE…”
  5. 5

    Microsystems engineering Metrology and inspection III by Goreck, Christophe

    Published 2003
    “…SPIE…”
  6. 6

    Optical metrology for arts and multimedia by Salimbeni, Renzo

    Published 2003
    “…SPIE…”
  7. 7

    Speckle metrology 2003 proceedings 18-20 June, 2003, Trondheim, Norway by Gastinger, Kay, Lokberg, Ole Johan, Winther, Svein

    Published 2003
    “…SPIE…”
  8. 8

    Handbook of medical imaging. Vol. 3 by Horii, Steven C., Kim, Yongmin

    Published 2000
    “…SPIE Press ,…”
  9. 9

    Computed tomography principles,design,artifacts,and resent advances by Hsieh, Jiang

    Published 2009
    “…Wiley Interscience SPIE Press…”