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Ultra large scale integration
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Integrated circuits
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Ultra large scale integration
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Digital integrated circuits
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Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 : editor...
by
Seiler, David G.
Published 2003
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Analysis and design of digital integrated circuits : in deep submicron technology
by
Hodges, David A. [ (David Alvin)]
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Jackson, Horace G.
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Saleh, Resve A.
Published 2004
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T - Technology
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OPEN SHELF (30 DAYS)
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Hodges, David A. [ (David Alvin)]
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International Conference on Characterization and Metrology for ULSI Technology
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Jackson, Horace G.
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National Institute of Standards and Technology
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Saleh, Resve A.
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Seiler, David G.
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