An introduction to multilevel modeling techniques MLM and SEM approaches using Mplus

Bibliographic Details
Main Authors: Heck, Ronald H. (Author), Thomas, Scott Loring (Author)
Format: Book
Language:English
Published: New York, NY Routledge, Taylor & Francis Group c2015
Edition:Third edition
Series:Quantitative methodology series
Subjects:
Description
Physical Description:xviii, 440 pages illustration 24 cm
ISBN:9781315746494
9781848725515
9781848725522