Practical non-destructive testing

Aims to cover the principles, procedures, applications, limitations, codes and standards widely used in non-destructive testing (NDT) techniques. In this book, the authors added techniques on Neutron radiography, Pulsed Eddy Current Testing, Low Frequency Eddy Current Testing, SQUID based Eddy Curre...

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Bibliographic Details
Main Authors: Raj, Baldev , 1947- (Author), Jayakumar, T. (Author), Thavasimuthu, M. (Author)
Format: Book
Language:English
Published: Oxford, England : Alpha Science International , c2007
Edition:3rd ed
Subjects:

MARC

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005 20140128093000.0
008 130619s2007 enk eng
020 |a 184265375X (hardback : alk. paper) 
020 |a 9781842653753 (hardback : alk. paper) 
050 0 0 |a TA417.2   |b .R35 2007 
090 0 0 |a TA417.2   |b .R35 2007 
100 1 |a Raj, Baldev ,   |d 1947- ,   |e author 
245 1 0 |a Practical non-destructive testing   |c Baldev Raj, T. Jayakumar, M. Thavasimuthu 
250 |a 3rd ed 
260 |a Oxford, England :   |b Alpha Science International ,   |c c2007 
300 |a xvi, 211 p. :   |b ill. ;   |c 25 cm. 
504 |a Includes bibliographical references (p. [203]-205) and index 
505 0 |a 1. Nondestructive testing - an introduction -- 2. Visual inspection -- 3. Liquid penetrant testing -- 4. Magnetic particle testing -- 5. Eddy current testing -- 6. Radiography -- 7. Ultrasonic testing -- 8. Acoustic emission testing -- 9. Thermography -- 10. In-situ metallographic examination -- 11. Leak testing -- 12. Comparison and selection of NDT methods -- 13. Probability of detection concepts in NDT -- 14. Statistical methods for quality control -- 15. Codes, standards, specification and procedures 
520 |a Aims to cover the principles, procedures, applications, limitations, codes and standards widely used in non-destructive testing (NDT) techniques. In this book, the authors added techniques on Neutron radiography, Pulsed Eddy Current Testing, Low Frequency Eddy Current Testing, SQUID based Eddy Current Testing and Mechanical Impedance Analysis 
650 0 |a Nondestructive testing 
700 1 |a Jayakumar, T. ,   |e author 
700 1 |a Thavasimuthu, M. ,   |e author 
999 |a 1000159895   |b Book   |c OPEN SHELF (30 DAYS)   |e Gong Badak Campus