Landmark intellectual property cases and their legacy : IEEM international intellectual property conferences

Bibliographic Details
Main Authors: Heath, Christopher (Author), Kamperman Sanders, Anselm (Author)
Format: Book
Language:English
Published: Alphen aan den Rijn, The Netherlands Kluwer Law International c2011
Subjects:
Description
Physical Description:xxii, 247 p. ill. 25 cm
ISBN:9789041133434 (hardback)