Software metrics and software metrology

Bibliographic Details
Main Author: Abran, Alain 1949- (Author)
Format: Book
Language:English
Published: Hoboken, NJ Los Alamitos, CA Wiley IEEE Computer Society c2010
Subjects:
Description
Physical Description:xix, 328 p. ill. 24 cm.
ISBN:0470597208 (pbk.)
9780470597200 (pbk.)