Software metrics and software metrology

Bibliographic Details
Main Author: Abran, Alain , 1949- (Author)
Format: Book
Language:English
Published: Hoboken, NJ : Los Alamitos, CA : Wiley IEEE Computer Society , c2010
Subjects:
Description
Physical Description:xix, 328 p. : ill. ; 24 cm.
Bibliography:Includes bibliographical references and index
ISBN:0470597208 (pbk.)
9780470597200 (pbk.)