Understanding the small world : an insight into the application of transmission electron microscopy in characterizing epitaxial layers
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Kangar :
Penerbit Universiti Malaysia Perlis ,
c2010
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| Series: | Professorial lecture series
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| Subjects: |
Table of Contents:
- 1. Transmission electron microscopy
- 2. Epitaxial growth of semiconductors
- 3. Defects studies in semiconducting thin films
- 4. Concluding remarks