Semiconductor material and device characterization
| Main Author: | |
|---|---|
| Format: | Book |
| Published: |
Piscataway,NJ : Hoboken,N.J :
IEEE Press Wiley ,
c2006
|
| Edition: | 3rd ed |
| Subjects: | |
| Online Access: | Contributor biographical information Publisher description Table of contents only |
MARC
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|---|---|---|---|
| 001 | 0000050618 | ||
| 005 | 20190715093000.0 | ||
| 008 | 060815s2006 njua eng | ||
| 020 | |a 0471739065 | ||
| 020 | |a 9780471739067 | ||
| 090 | 0 | 0 | |a QC611 |b .S33 2006 |
| 100 | 1 | |a Schroder, Dieter K. , |e author | |
| 245 | 1 | 0 | |a Semiconductor material and device characterization |c Dieter K. Schroder |
| 250 | |a 3rd ed | ||
| 260 | |a Piscataway,NJ : |b IEEE Press |a Hoboken,N.J : |b Wiley , |c c2006 | ||
| 300 | |a xv, 779 p. : |b ill. ; |c 25 cm. | ||
| 500 | |a "Wiley-Interscience" | ||
| 504 | |a Includes bibliographical references and index | ||
| 650 | 0 | |a Semiconductors | |
| 650 | 0 | |a Semiconductors |x Testing | |
| 856 | 4 | |3 Contributor biographical information |u http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html | |
| 856 | 4 | |3 Publisher description |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html | |
| 856 | 4 | |3 Table of contents only |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html | |
| 999 | |a 1000112452 |b Book |c OPEN SHELF (30 DAYS) |e Gong Badak Campus | ||