Semiconductor material and device characterization

Bibliographic Details
Main Author: Schroder, Dieter K. (Author)
Format: Book
Published: Piscataway,NJ : Hoboken,N.J : IEEE Press Wiley , c2006
Edition:3rd ed
Subjects:
Online Access:Contributor biographical information
Publisher description
Table of contents only

MARC

LEADER 00000cam a2200000 7i4500
001 0000050618
005 20190715093000.0
008 060815s2006 njua eng
020 |a 0471739065 
020 |a 9780471739067 
090 0 0 |a QC611   |b .S33 2006 
100 1 |a Schroder, Dieter K. ,   |e author 
245 1 0 |a Semiconductor material and device characterization   |c Dieter K. Schroder 
250 |a 3rd ed 
260 |a Piscataway,NJ :   |b IEEE Press   |a Hoboken,N.J :   |b Wiley ,   |c c2006 
300 |a xv, 779 p. :   |b ill. ;   |c 25 cm. 
500 |a "Wiley-Interscience" 
504 |a Includes bibliographical references and index 
650 0 |a Semiconductors 
650 0 |a Semiconductors   |x Testing 
856 4 |3 Contributor biographical information   |u http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html 
856 4 |3 Publisher description   |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html 
856 4 |3 Table of contents only   |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html 
999 |a 1000112452   |b Book   |c OPEN SHELF (30 DAYS)   |e Gong Badak Campus