Schroder, D. K. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press Wiley.
Chicago Style (17th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. Piscataway,NJ Hoboken,N.J: IEEE Press Wiley, 2006.
MLA (9th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press Wiley, 2006.
Warning: These citations may not always be 100% accurate.