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|a 0819447285
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| 090 |
0 |
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|a QC427.8.S64
|b S65 2003
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| 245 |
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|a Speckle metrology 2003
|b proceedings
|b 18-20 June, 2003, Trondheim, Norway
|c editors, Kay Gastinger, Ole Johan Lّkberg, Svein Winther
|f sponsored and organized by SINTEF (Norway), NTNU--Norwegian University of Science and Technology (Norway)
|f cooperating organizations, SPIE--the International Society for Optical Engineering, EOS--European Optical Society
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| 260 |
2 |
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|a Bellingham, Washington
|b SPIE
|c c2003
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| 300 |
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|a ix, 390 p.
|b ill.
|c 28 cm
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| 650 |
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|a Speckle metrology
|v Congresses
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| 650 |
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0 |
|a Speckle
|v Congresses
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| 700 |
1 |
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|a Gastinger, Kay
|e author
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| 700 |
1 |
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|a Lokberg, Ole Johan
|e author
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| 700 |
1 |
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|a Winther, Svein
|e author
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| 710 |
2 |
1 |
|a European Optical Society
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| 710 |
2 |
1 |
|a Norges teknisk-naturvitenskapelige universitet
|
| 710 |
2 |
1 |
|a SINTEF-gruppen (Norway)
|
| 710 |
2 |
1 |
|a Society of Photo-optical Instrumentation Engineers
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| 999 |
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|a 1000099384
|b Book
|c OPEN SHELF (30 DAYS)
|e Gong Badak Campus
|