Speckle metrology 2003 : proceedings :

Bibliographic Details
Main Authors: Gastinger, Kay (Author), Lokberg, Ole Johan (Author), Winther, Svein (Author)
Corporate Authors: European Optical Society, Norges teknisk-naturvitenskapelige universitet, SINTEF-gruppen (Norway), Society of Photo-optical Instrumentation Engineers
Format: Book
Published: Bellingham, Washington : SPIE , c2003
Subjects:

MARC

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008 040628s2003
020 |a 0819447285 
090 0 0 |a QC427.8.S64   |b S65 2003 
245 0 0 |a Speckle metrology 2003 :   |b proceedings :   |b 18-20 June, 2003, Trondheim, Norway   |c editors, Kay Gastinger, Ole Johan Lّkberg, Svein Winther   |f sponsored and organized by SINTEF (Norway), NTNU--Norwegian University of Science and Technology (Norway)   |f cooperating organizations, SPIE--the International Society for Optical Engineering, EOS--European Optical Society 
260 2 |a Bellingham, Washington :   |b SPIE ,   |c c2003 
300 |a ix, 390 p. :   |b ill. ;   |c 28 cm. 
504 |a Includes bibliographic references and author index 
650 0 |a Speckle metrology   |v Congresses 
650 0 |a Speckle   |v Congresses 
700 1 |a Gastinger, Kay ,   |e author 
700 1 |a Lokberg, Ole Johan ,   |e author 
700 1 |a Winther, Svein ,   |e author 
710 2 1 |a European Optical Society 
710 2 1 |a Norges teknisk-naturvitenskapelige universitet 
710 2 1 |a SINTEF-gruppen (Norway) 
710 2 1 |a Society of Photo-optical Instrumentation Engineers 
999 |a 1000099384   |b Book   |c OPEN SHELF (30 DAYS)   |e Gong Badak Campus