Speckle metrology 2003 : proceedings :
| Main Authors: | , , |
|---|---|
| Corporate Authors: | , , , |
| Format: | Book |
| Published: |
Bellingham, Washington :
SPIE ,
c2003
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| Subjects: |
| Physical Description: | ix, 390 p. : ill. ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographic references and author index |
| ISBN: | 0819447285 |