Lightmetry 2002 : metrology and testing techniques using light

Bibliographic Details
Main Authors: Pluta, Maksymilian (Author), Powichrowska, Ewa (Author), Szyjer, Mariusz (Author)
Corporate Author: The International Society for Optical Engineering
Format: Book
Published: Washington : SPIE , c2003
Series:SPIE proceedings series 5064
Subjects:

MARC

LEADER 00000cam a2200000 7i4500
001 0000047198
005 20201108.0
008 040628s2003
020 |a 0819448702 
090 0 0 |a QC367   |b .L54 2003 
245 1 0 |a Lightmetry 2002 :   |b metrology and testing techniques using light 
260 2 |a Washington :   |b SPIE ,   |c c2003 
300 |a xx, 338 p :   |b ill ;   |c 28 cm. 
440 0 0 |a SPIE proceedings series   |v 5064 
504 |a Includes bibliographical references and author index 
650 0 |a Light   |x Congresses 
650 0 |a Mensuration   |x Congresses 
650 0 |a Optical detectors   |v Congresses 
650 0 |a Optical measurements   |v Congresses 
650 0 |a Polarization(Light)   |x Congresses 
700 1 |a Pluta, Maksymilian ,   |e author 
700 1 |a Powichrowska, Ewa ,   |e author 
700 1 |a Szyjer, Mariusz ,   |e author 
710 1 1 |a The International Society for Optical Engineering 
740 0 0 |a Proceedings of SPIE 
999 |a 1000099376   |b Book   |c Reference   |e Gong Badak Campus