|
|
|
|
| LEADER |
00000cam a2200000 7i4500 |
| 001 |
0000045461 |
| 005 |
20080709093000.0 |
| 008 |
080226s2005 nyu eng |
| 020 |
|
|
|a 0130430285
|
| 020 |
|
|
|a 9780130430281
|
| 090 |
0 |
0 |
|a QC53
|b .B44 2005
|
| 100 |
1 |
|
|a Bentley, John P. ,
|d 1943- ,
|e author
|
| 245 |
1 |
0 |
|a Principles of measurement systems
|c John P. Bentley
|
| 250 |
|
|
|a 4th ed
|
| 260 |
|
|
|a New York :
|b Pearson Prentice Hall ,
|c 2005
|
| 300 |
|
|
|a xiv, 528 p. :
|b ill. ;
|c 25 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 505 |
0 |
|
|a 1. The general measurement system -- 2. Static characteristics of measurement system elements -- 3. The accuracy of measurement systems in the steady state -- 4. Dynamic characteristics of measurement systems -- 5. Loading effects and two-port networks -- 6. Signals and noise in measurement systems -- 7. Reliability, choice and economics of measurement systems -- 8. Sensing elements -- 9. Signal conditioning elements -- 10. Signal processing elements and software -- 11. Data presentation elements -- 12. Flow measurement systems -- 13. Intrinsically safe measurement systems -- 14. Heat transfer effects in measurement systems -- 15. Optical measurement systems -- 16. Ultrasonic measurement systems -- 17. Gas chromatography -- 18. Data acquisition and communication systems -- 19. The intelligent multivariable measurement system
|
| 650 |
|
0 |
|a Automatic control
|
| 650 |
|
0 |
|a Engineering instruments
|
| 650 |
|
0 |
|a Physical instruments
|
| 650 |
|
0 |
|a Physical measurements
|
| 999 |
|
|
|a 1000109175
|b Book
|c OPEN SHELF (30 DAYS)
|e Gong Badak Campus
|