Search Results - International Centre for Diffraction Data

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  1. 1
    Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films

    Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films by Wang, Xiaodong, Van Riessen, Arie

    Published 2017
    “…International Centre for Diffraction Data…”
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  2. 2
    Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

    Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector by Kirkwood, H., de Jonge, M., Howard, D., Ryan, C., van Riessen, G., Hofmann, F., Rowles, Matthew, Paradowska, A., Abbey, B.

    Published 2017
    “…International Centre for Diffraction Data…”
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  3. 3
    Temperature-Dependent Structural Behaviour of Samarium Cobalt Oxide

    Temperature-Dependent Structural Behaviour of Samarium Cobalt Oxide by Rowles, Matthew, Wang, C., Chen, K., Li, N.

    Published 2017
    “…International Centre for Diffraction Data…”
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  4. 4
    CONVAS2: A program for the merging of diffraction data

    CONVAS2: A program for the merging of diffraction data by Rowles, Matthew

    Published 2010
    “…International Centre for Diffraction Data…”
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  5. 5
    Characterisation of K-doped Bi4V2O11 by combined XRD and EPMA: a cautionary tale

    Characterisation of K-doped Bi4V2O11 by combined XRD and EPMA: a cautionary tale by Lee, Chnoong Kheng, Coats, Alison M., West, Anthony Roy

    Published 1997
    “…International Centre for Diffraction Data…”
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