Search Results - Andy Goode

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    Depth Analysis for Sensitivity Pattern Section in the Electrical Resistivity using the 2D Computerized Modeling Method by Bery, Andy Anderson

    Published 2014
    “…The medium depth of investigation (Zm) from the sensitivity pattern of different arrays influences the array selection which is good enough for planning infield surveys. In this paper, the average maximum for data level n value for inline dipole-dipole, pole-dipole and Wenner-Schlumberger for a good subsurface investigation is 6. …”
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