Search Results - "depth profiling"

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling by Bailey, James, Havelund, Rasmus, Shard, Alexander G., Gilmore, Ian S., Alexander, Morgan R., Sharp, James S., Scurr, David J.

Subjects: “…ToF-SIMS; Argon; Depth; Profiling; Polymer; Multilayers…”
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Investigating native and exogenous compounds within skin tissue by Starr, Nichola

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A comparative study of x-ray shielding capability in ion-implanted acrylic and glass by Noor Azman, N., Siddiqui, Salim, Ionescu, M., Low, It Meng

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Oxidation characteristics of Ti3AlC2, Ti3SiC2 and Ti2AlC by Pang, Wei Kong, Oo, Zeya, Hanna, J, Low, It Meng

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The impact of seasonal waterlogging on the depth-wise distribution of major and trace metals in the soils of the eastern Ganges basin by Rajmohan, N., Ramasamy, Nagarajan, Jayaprakash, M., Prathapar, S.A.

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