Search Results - "X-ray reflectivity"

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    In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth

    In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth by Moulin, J., Dinelli, F., Massi, Massimiliano, Albonetti, C., Kshirsagar, R., Biscarini, F.

    Published 2006
    Subjects: Get full text

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