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    Structural and photoluminescence analysis on the implantation of carbon and proton for the creation of damage-assisted emission in silicon

    Structural and photoluminescence analysis on the implantation of carbon and proton for the creation of damage-assisted emission in silicon by Nurul Ellena Abdul Razak, Madhuku, Morgan, Ahmad, Ishaq, Burhanuddin Yeop Majlis, Chang, Fu Dee, Dilla Duryha Berhanuddin

    Published 2020
    “…Profiling analysis was carried out using computational Stopping and Range of Ions in Matter (SRIM) and Surrey University Sputter Profile Resolution from Energy Deposition (SUSPRE) simulation. …”
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