Search Results - "Semiconductor Device Reliability"

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    Transient out-of-SOA robustness of SiC power MOSFETs

    Transient out-of-SOA robustness of SiC power MOSFETs by Castellazzi, Alberto, Fayyaz, Asad, Romano, Gianpaolo, Riccio, Michele, Irace, Andrea, Urresti-Ibanez, Jesus, Wright, Nick

    Published 2017
    Subjects: Get full text

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