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    Influence of design parameters on the short-circuit ruggedness of SiC Power MOSFETs by Romano, Gianpaolo, Riccio, Michele, Maresca, Luca, Fayyaz, Asad, Castellazzi, Alberto

    Published 2016
    Subjects: “…Silicon Carbide (SiC) Power MOSFET; Short-circuit failure; Short-Circuit ruggedness; Thermal Runaway; hot-spot; TCAD 2D simulation…”
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