Search Results - "Robustness"

Refine Results
  1. 1

    System analysis and robustness by Moggi, Eugenio, Farjudian, Amin, Taha, Walid

    Published 2019
    Subjects: “…Analyses; Robustness; Domain theory…”
    Get full text
  2. 2
  3. 3
  4. 4

    Safe & robust reachability analysis of hybrid systems by Moggi, Eugenio, Farjudian, Amin, Duracz, Adam, Taha, Walid

    Published 2018
    Subjects: “…Hybrid systems; Reachability; Robustness; Domain theory…”
    Get full text
  5. 5
  6. 6
  7. 7

    SiC power MOSFETs performance, robustness and technology maturity by Castellazzi, Alberto, Fayyaz, Asad, Romano, G., Yang, Li, Riccio, M., Irace, A.

    Published 2016
    Subjects: “…Silicon Carbide (SiC); power MOSFETs; reliability; robustness…”
    Get full text
  8. 8
  9. 9
  10. 10

    Robust hydrophobic surfaces from suspension HVOF thermal sprayed rare-earth oxide ceramics coatings by Bai, Mingwen, Kazi, H., Zhang, X., Liu, J., Hussain, Tanvir

    Published 2018
    Subjects: “…Suspension HVOF; Rare Earth Oxide; Hydrophobic; Nano-structure; Robustness…”
    Get full text
  11. 11
  12. 12

    Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs by Fayyaz, A., Yang, L., Riccio, M., Castellazzi, Alberto, Irace, A.

    Published 2014
    Subjects: “…SiC; Power MOSFETs; Wide bandgap; Device characterisation; Reliability; Robustness…”
    Get full text
  13. 13

    Application of reliability-based robustness assessment of steel moment resisting frame structures under post-mainshock cascading events by Ribeiro, Filipe L.A., Barbosa, André R., Neves, Luís C.

    Published 2014
    Subjects: “…Aftershock; Nonlinear dynamic analysis; Robustness; Seismic sequences; Structural Safety and Reliability…”
    Get full text
  14. 14
  15. 15
  16. 16
  17. 17
  18. 18

    Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs by Fayyaz, Asad, Castellazzi, Alberto, Romano, G., Riccio, M., Urresti, J., Wright, N.

    Published 2017
    Subjects: “…avalanche ruggeddness; silicon carbide; unclamped inductive swithching; power MOSFET; robustness…”
    Get full text
  19. 19
  20. 20