Search Results - "MOSFETs"

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    SiC power MOSFETs performance, robustness and technology maturity by Castellazzi, Alberto, Fayyaz, Asad, Romano, G., Yang, Li, Riccio, M., Irace, A.

    Published 2016
    Subjects: “…Silicon Carbide (SiC); power MOSFETs; reliability; robustness…”
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    Full SiC Version of the EDA5 Inverter by Chowdhury, Shajjad, Gurpinar, Emre, Castellazzi, Alberto

    Published 2017
    Subjects: “…SiC MOSFETs; multilevel converter; hybrid single phase converter…”
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    Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs by Fayyaz, A., Yang, L., Riccio, M., Castellazzi, Alberto, Irace, A.

    Published 2014
    Subjects: “…SiC; Power MOSFETs; Wide bandgap; Device characterisation; Reliability; Robustness…”
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    Experimental comparison of a matrix converter using Si IGBT and SiC MOSFETs by Trentin, Andrew, De Lillo, Liliana, Empringham, Lee, Wheeler, Patrick, Clare, Jon C.

    Published 2015
    Subjects: “…IGBTs; MOSFETs; Matrix converter;insulated gate bipolar; transistors (IGBTs); matrix converter (MC)…”
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    Modular integrated SiC MOSFET matrix converter by Aliyu, Attahir Murtala, Castellazzi, Alberto, Lasserre, Philippe, Delmonte, N.

    Published 2017
    Subjects: “…Wide Band-Gap power Devices; SiC Power MOSFETs; Matrix converters…”
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    Optimization of thermal management and power density of small-scale wind turbine applications using SiC-MOSFETs by Hussein, Abdallah, Castellazzi, Alberto

    Published 2017
    Subjects: “…Small-scale wind turbine; Wind speed distribution; Thermal management; SiC-MOSFETs; Two-level converters…”
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    High temperature pulsed-gate robustness testing of SiC power MOSFETs by Fayyaz, A., Castellazzi, A.

    Published 2015
    Subjects: “…SiC; Power MOSFETs; Gate-oxide reliability; Robustness; Wide bandgap; SiC/SiO2 interface…”
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    Body diode reliability investigation of SiC power MOSFETs by Fayyaz, A., Romano, G., Castellazzi, Alberto

    Published 2016
    Subjects: “…Silicon carbide; Wide bandgap; Power MOSFET; Body diode; Reliability…”
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    UIS failure mechanism of SiC power MOSFETs by Fayyaz, Asad, Castellazzi, Alberto, Romano, Gianpaolo, Riccio, Michele, Urresti, J., Wright, Nick

    Published 2016
    Subjects: “…Silicon carbide; MOSFET; Avalanche breakdown; Avalanche ruggedness; Unclamped inductive switching…”
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