Search Results - "MOSFET"

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    Body diode reliability investigation of SiC power MOSFETs by Fayyaz, A., Romano, G., Castellazzi, Alberto

    Published 2016
    Subjects: “…Silicon carbide; Wide bandgap; Power MOSFET; Body diode; Reliability…”
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    UIS failure mechanism of SiC power MOSFETs by Fayyaz, Asad, Castellazzi, Alberto, Romano, Gianpaolo, Riccio, Michele, Urresti, J., Wright, Nick

    Published 2016
    Subjects: “…Silicon carbide; MOSFET; Avalanche breakdown; Avalanche ruggedness; Unclamped inductive switching…”
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    Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs by Fayyaz, Asad, Castellazzi, Alberto, Romano, G., Riccio, M., Urresti, J., Wright, N.

    Published 2017
    Subjects: “…avalanche ruggeddness; silicon carbide; unclamped inductive swithching; power MOSFET; robustness…”
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    Using multi time-scale electro-thermal simulation approach to evaluate SiC-MOSFET power C=converter in virtual prototyping design tool by Li, Ke, Evans, Paul, Johnson, Christopher Mark

    Published 2017
    Subjects: “…Virtual prototyping; Multi time-scale; Electro-thermal simulation; SiC-MOSFET; Parasitic inductance; Switching losses…”
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    Experimental and analytical performance evaluation of SiC power devices in the matrix converter by Safari, Saeed, Castellazzi, Alberto, Wheeler, Patrick

    Published 2014
    Subjects: “…Normally-off SiC JFET; SiC MOSFET; SiC BJT; power losses evaluation; matrix converter…”
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    SiC and GaN power transistors switching energy evaluation in hard and soft switching conditions by Li, Ke, Evans, Paul, Johnson, Christopher Mark

    Published 2016
    Subjects: “…Wide bandgap power semiconductor device; GaN-HEMT; SiC-MOSFET; Switching energy; Hard switching; Soft switching…”
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    SiC/GaN power semiconductor devices theoretical comparison and experimental evaluation by Li, Ke, Evans, Paul, Johnson, Christopher Mark

    Published 2016
    Subjects: “…Wide bandgap power semiconductor device; GaN-HEMT; SiC-JFET; SiC-MOSFET; Conduction loss; Switching loss…”
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    SiC power MOSFETs performance, robustness and technology maturity by Castellazzi, Alberto, Fayyaz, Asad, Romano, G., Yang, Li, Riccio, M., Irace, A.

    Published 2016
    Subjects: “…Silicon Carbide (SiC); power MOSFETs; reliability; robustness…”
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