A new scan design technique based on pre-synthesis thru functions

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A new scan design technique based on pre-synthesis thru functions

VLSI design has moved from bottom-up design approach to top-down design methodology with the aid of advanced Computer-Aided Design (CAD) technology. This paper introduces a new scan design technique as a design-for-test (DFT) method for sequential circuits by exploiting the information of thru funct...

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Bibliographic Details
Main Authors:	Chia, Yee Ooi, Fujiwara, Hideo
Format:	Book Section
Published:	IEEE Computer Society 2006
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utm.my/9313/

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