A new scan design technique based on pre-synthesis thru functions
VLSI design has moved from bottom-up design approach to top-down design methodology with the aid of advanced Computer-Aided Design (CAD) technology. This paper introduces a new scan design technique as a design-for-test (DFT) method for sequential circuits by exploiting the information of thru funct...
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| Format: | Book Section |
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IEEE Computer Society
2006
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| Online Access: | http://eprints.utm.my/9313/ |
| _version_ | 1848891837036625920 |
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| author | Chia, Yee Ooi Fujiwara, Hideo |
| author_facet | Chia, Yee Ooi Fujiwara, Hideo |
| author_sort | Chia, Yee Ooi |
| building | UTeM Institutional Repository |
| collection | Online Access |
| description | VLSI design has moved from bottom-up design approach to top-down design methodology with the aid of advanced Computer-Aided Design (CAD) technology. This paper introduces a new scan design technique as a design-for-test (DFT) method for sequential circuits by exploiting the information of thru functions available at high-level description of the circuit. This DFT method reduces the number of flip-flops to be converted into scan flip-flops because some existing thru functions allow the flip-flops to be controllable from primary inputs or observable at primary outputs or both. Moreover, the DFT method can be applied to both structural RT-level circuits and gate-level circuits. The paper also presents a test generation procedure for the augmented sequential circuits using a combinational ATPG tool. The experimental results show the comparison of our DFT method with conventional scan techniques in terms of hardware overhead, test generation time, fault coverage, fault efficiency and test application time. |
| first_indexed | 2025-11-15T21:04:18Z |
| format | Book Section |
| id | utm-9313 |
| institution | Universiti Teknologi Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-15T21:04:18Z |
| publishDate | 2006 |
| publisher | IEEE Computer Society |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | utm-93132017-09-02T08:36:28Z http://eprints.utm.my/9313/ A new scan design technique based on pre-synthesis thru functions Chia, Yee Ooi Fujiwara, Hideo TK Electrical engineering. Electronics Nuclear engineering VLSI design has moved from bottom-up design approach to top-down design methodology with the aid of advanced Computer-Aided Design (CAD) technology. This paper introduces a new scan design technique as a design-for-test (DFT) method for sequential circuits by exploiting the information of thru functions available at high-level description of the circuit. This DFT method reduces the number of flip-flops to be converted into scan flip-flops because some existing thru functions allow the flip-flops to be controllable from primary inputs or observable at primary outputs or both. Moreover, the DFT method can be applied to both structural RT-level circuits and gate-level circuits. The paper also presents a test generation procedure for the augmented sequential circuits using a combinational ATPG tool. The experimental results show the comparison of our DFT method with conventional scan techniques in terms of hardware overhead, test generation time, fault coverage, fault efficiency and test application time. IEEE Computer Society 2006 Book Section PeerReviewed Chia, Yee Ooi and Fujiwara, Hideo (2006) A new scan design technique based on pre-synthesis thru functions. In: Proceedings of the 15th Asian Test Symposium. IEEE Computer Society, Washington, DC, USA, pp. 163-168. ISBN 0-7695-2628-4 http://ieeexplore.ieee.org/document/4030763/?reload=true DOI : 10.1109/ATS.2006.11 |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Chia, Yee Ooi Fujiwara, Hideo A new scan design technique based on pre-synthesis thru functions |
| title | A new scan design technique based on pre-synthesis thru functions |
| title_full | A new scan design technique based on pre-synthesis thru functions |
| title_fullStr | A new scan design technique based on pre-synthesis thru functions |
| title_full_unstemmed | A new scan design technique based on pre-synthesis thru functions |
| title_short | A new scan design technique based on pre-synthesis thru functions |
| title_sort | new scan design technique based on pre-synthesis thru functions |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.utm.my/9313/ http://eprints.utm.my/9313/ http://eprints.utm.my/9313/ |